JEOL JEM-3010 Materials Science Transmission Electron Microscope Oxford EDS TEM
USD 89995.00 USD
Specifications
| Brand | Jeol |
| Magnification Range | 300 kv |
| Microscope Type | 300 kv |
| Model | JEM-3010 |
| Country Of Origin | Japan |
Professionally deinstalled analytical TEM system. It is now in storage with column under vacuum. Previously under JEOL service contract. Oxford X‑Max 80 mm² Silicon Drift Detector installed. Oxford INCA Analyzer and Oxford AZtec EDS Software.
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